High-Speed Interface Testing

1.Problem of High-Speed Interface Macro Testing Because the function of the chip is guaranteed, the high-speed function test is important. Moreover, it is an important issue in LSI test how cheaply to do this test. The high-speed function test in an internal logical circuit can be tested by using BIST methodology and the output clock of PLL with a low-speed and low-cost ATE. However, the high-speed function test to the Interface macro should do the interface at high speed between the Interface cell and the ATE. Therefore, a high-speed ATE is needed for this. This ATE is very expensive, and enlarges the test cost of the product which builds in this macro. It is a issue of the semiconductor vender who offers the product with High-Speed Interface to reduce the test-cost of this without lowering the quality of the product.